Top Right Gradient Curve
Home Intro News Experts Equipments Research Links


 Site Search
Search powered by Google



Read Chinese



Equipments

Equipment Classification


  • For collaborative research proposals with significant scientific impact

  • Priority of usage based upon scientific merits of each research proposal; publication of names of users and all submitted research proposals

  • Collaborations conducted under the guidance and consultation of technical experts



  • Open to all kinds of research projects

  • Independent work without supervision for certified users



  • Not open to general users during development

  • For custom development and enhancement of special functionalities

  • Requirements of professional expertise and uniqueness of functionality




Equipments

Cs Corrector + JEOL 2100F STEM
Field Emission Scanning Transmission Electron Microscope (FE-STEM)
Analytical Electron Microscope (AEM)
Transmission Electron Microscope (TEM)
Field Emission- Scanning Electron Microscope (FE-SEM)
Atomic Force Microscope (AFM)




Related Information

>>More...

 Journal and papers

>>More...

Copyright ©2005 Center for Microscopy and Nano Analysis, CMNA