現有儀器

球像差修正掃描穿透式電子顯微鏡 Cs Corrector + JEOL 2100F Scanning Transmission Electron Microscope(STEM)

200kV場發射掃描穿透式電子顯微鏡 FEI-Tecnai-G2-F20 Scanning Transmission Electron Microscope(STEM)

分析穿透式電子顯微鏡 JEOL, JEM-2000FX Conventional Transmisson Electron Microscope(TEM)

場發射掃描式電子顯微鏡 JEOL JSM-6700F Scanning Electron Microscope(SEM)