Recent Developments in Electron Microscopy and the Study of Novel 2D Materials Grown in Interlayer Voids

林永昌博士 Dr. Yung-Chang Lin from Nanomaterials Research Institute National Institute of Advanced Industrial Science and Technology (AIST)

@ Room 212, PHYSICS/CCMS Building

Abstract:

This presentation is divided into two parts. The first part will introduce the latest developments and research trends in electron microscopy, including advancements in spatial and energy resolution. Various technological advancements will be illustrated with relevant research examples, aiming to provide experts and students from different research fields with practical material analysis techniques. The second part will present the latest research findings on novel 2D materials grown in interlayer spacings. For nearly a century, intercalation materials have played a crucial role in conductive materials and battery systems. However, past studies have not truly observed the arrangement of the intercalated substances within the interlayer spacings. In this research, bilayer graphene is used as a substrate, with metal chlorides and alkali metals intercalated into its interlayer voids. Electron microscopy is then utilized to analyze the atomic arrangement and dynamic structures, revealing entirely new structures that can only exist in the intercalation space.

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